Glass / Ceramic
Silicon dioxide, stishovite structure (SiO2)
Open JARVIS-DFT screening card for SiO2: density, elastic moduli, structure, and selected calculated electronic/energy fields.
Properties
Physical
| Property | Value | Unit |
|---|---|---|
| Density | 4148 | kg/m^3 |
Mechanical
| Property | Value | Unit |
|---|---|---|
| Bulk modulus | 293.72 | GPa |
| Shear modulus | 220.85 | GPa |
| Young's modulus | 529.7706536238328 | GPa |
| Poisson's ratio | 0.21 | - |
Electronic
| Property | Value | Unit |
|---|---|---|
| DFT band gap | 5.573 | eV |
Identity
| Property | Value | Unit |
|---|---|---|
| Chemical formula | SiO2 | - |
Structure
| Property | Value | Unit |
|---|---|---|
| Crystal system | tetragonal | - |
| Space group | P4_2/mnm (No. 136) | - |
Thermodynamic
| Property | Value | Unit |
|---|---|---|
| Formation energy per atom | -2.79079 | eV/atom |
Units
Condition
- Condition
- ideal computational crystal
- Product form
- periodic bulk crystal model
- Thickness / diameter range
- Not applicable to the computational unit cell.
- Test direction
- Voigt isotropic elastic average.
- Processing route
- Static DFT relaxation using the upstream JARVIS workflow.
- Temperature range
- 0 ... 0 K
- Notes
- Computational screening values, not measured material-card values. Verify phase, composition, porosity, defects, temperature, processing, and product form.
Standards
No material standards linked.
Record status
- Category
- Glass / Ceramic
- Unit system
- Common SI